High/Low Temperature Test Machine / Thermal Shock Test System
High and low temperature testing, thermal shock testing available! Providing suitable systems according to needs.
The high and low temperature testing machine is our original system capable of automatic aging function testing from electronic components to finished products. It achieves inline operation from low temperature (-40°C) to high temperature (+125°C). We have realized inline high and low temperature aging function testing for various applications from devices (BGA, HIC, etc.) to mounted circuit boards. 【Features】 ■ Can transport 180 workpieces in the chamber with a 25-second cycle time ■ The low temperature chamber incorporates W coils internally ■ The low temperature chamber has no time loss for defrosting and allows continuous operation ■ Can be installed in a space-saving manner ■ High-speed movement from the low temperature side to the high temperature side enables heat shock testing *For more details, please refer to the PDF document or feel free to contact us.
- Company：ヒーバックシステム
- Price：Other
